Optical metrology area
- Distance measurement; Measuring diameter, width or thickness of objects, surface speeds.
Contact:
egrumel@ciop.unlp.edu.ar
- Alignment, positioning and control of large precision machine components and sub-millimeter (engines, bridges, structures, etc.).
Contact:
gallardom@ciop.unlp.edu.ar
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Remote sensing of displacement. Microdisplacement measurement using digital speckle interferometry. Holographic interferometry.
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Diagnosis and image processing. Applications to count objects and determination of geometric properties.
Contact:
hector@ciop.unlp.edu.ar
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Design and manufacture of devices for identifying objects.
Contact:
nestorb@ciop.unlp.edu.ar ; myrianc@ciop.unlp.edu.ar
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Identification and documentation security and protection products.
Contact:
nestorb@ciop.unlp.edu.ar
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Fluid velocity measurement by Doppler.
Contact:
jorget@ciop.unlp.edu.ar
In the area of Optical fiber
- Calibration and certification of instruments linked to optical fiber links.
- Design and development of devices (amplifiers, lasers, ASE sources) and fiber-optic sensors.
- Application to the measurement of displacement in micro-and submicron ranges, deformation, vibration, temperature, corrosion.
Contact:
ricardod@ciop.unlp.edu.ar
- Advice on issues of optical fiber communications.
Contact: snoriega@ciop.unlp.edu.ar,
ricardod@ciop.unlp.edu.ar
Determination of average size of nano particles 50nm-150nm) and micrometric (1nm100nm).
Measurement of gaseous pollutants in air
In laser surface clearing
- Removing surface dirt from objects of cultural value, manufacturing, parts produced on an industrial scale, etc.
- Automatic measurement of soil level cleaning: Apply to surfaces of objects, manufacturing stage of production, industrial process control, etc.
Contact:
gabrielb@ciop.unlp.edu.ar
In determining the composition of materials by nondestructive spectroscopic methods.
- Applications to industrial processes and parts.
- Characterization of unique pieces, archaeological or heritage value.
Contact:
gabrielb@ciop.unlp.edu.ar
In characterization of light sources